An Accurate Characterization Method for Integrated Polarization Converters
نویسندگان
چکیده
We present a characterization method for polarization converters which improves the accuracy of traditional methods significantly. An experimental demonstration is presented on InP-membrane-on-silicon (IMOS) platform. The design and fabrication converter discussed, as well simulated conversion efficiency. A device only 4 microns shown to achieve 97.5%±0.5% conversion, corresponding an extinction ratio -16± 0.9 dB. compared new 4-port method, improved from up 20% 0.5%.
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ژورنال
عنوان ژورنال: IEEE Journal of Quantum Electronics
سال: 2021
ISSN: ['0018-9197', '1558-1713']
DOI: https://doi.org/10.1109/jqe.2020.3047119